术语表
常见的术语和英文缩写，一分钟查完就走。
| 缩写 | 英文全称 | 中文 |
|---|---|---|
| AEM | Analytical Electron Microscope | 分析型电子显微镜 |
| AES | Auger Electron Spectroscopy | 俄歇电子谱仪 |
| AFM | Atomic Force Microscope | 原子力显微镜 |
| AGS | Average Grain Size | 平均晶粒尺寸 |
| AI | Anisotropy Index | 各向异性指数 |
| AIA | Automatic Image Analysis | 自动图像分析 |
| APFEM | Atomic Probe Field Emission Microscopy | 原子探针场发射显微术 |
| ASM | Acoustic Scanning Microscope | 声扫描电子显微镜 |
| BEKP | Backscattered Electron Kikuchi Pattern | 背散射电子菊池花样 |
| BSE | Backscattered Electron | 背散射电子 |
| BSI | Backscattered Electron Image | 背散射电子图像 |
| CBED | Convergent Beam Electron Diffraction | 会聚束电子衍射 |
| CCD | Charge Coupled Device | 电荷耦合装置 |
| CI | Confidence Interval | 置信区间 |
| CL | Confidence Limit | 置信度 |
| CLM | Cathodoluminescence | 阴极电致发光分析 |
| CM | Confocal Microscopy | 共聚焦显微术 |
| CV | Coefficient of Variation | 变异系数 |
| DIC | Differential Interference Contrast | 微分干涉相衬 |
| EBIC | Electron Beam Induced Current | 电子束诱导电流 |
| EBSD | Electron Back Scatter Diffraction | 电子背散射衍射 |
| EBSP | Electron BackScattered Pattern | 电子背散射花样 |
| ECP | Electron Channeling Pattern | 电子通道花样 |
| EDS | Energy Dispersive Spectroscopy | 能谱分析 |
| EDXA | Energy Dispersive X-ray Analysis | 能量散射X射线分析 |
| EELS | Electron Energy Loss Spectroscopy | 电子能量损失谱仪 |
| EMMA | Electron Microscopy Microanalyzer | 电镜显微分析仪 |
| EMPA | Electron Microprobe Microanalysis | 电子显微探针微观分析 |
| EPMA | Electron Probe Microanalysis | 电子探针显微分析 |
| ESCA | Electron Spectroscopy for Chemical Analysis | 化学分析用电子谱仪 |
| ETD | Everhart-Thornley Detector | 二次电子探测器 |
| FEG | Field Emission Gun | 场发射电子枪 |
| FEM | Field Electron Microscopy | 场电子显微学 |
| FFT | Fast Fourier Transform | 快速傅立叶变换 |
| FIM | Field Ion Microscopy | 场离子显微镜 |
| GCP | Geometrically Close-Packed | 几何密排 |
| HB | Brinell Hardness Number | 布氏硬度值 |
| HEED | High Energy Electron Diffraction | 高能电子衍射 |
| HK | Knoop Hardness Number | 努氏硬度值 |
| HOLZ | High Order Laue Zone | 高阶劳厄带 |
| HR | Rockwell Hardness Number | 洛氏硬度值 |
| HV | Vickers Hardness Number | 维氏硬度值 |
| IA | Image Analysis | 图像分析 |
| IR | Infrared | 红外线 |
| JK | Jernkontoret | JK法（晶粒度评级） |
| LaB6 | Lanthanum Hexaboride Cathode | 六硼化镧阴极 |
| LEED | Low Energy Electron Diffraction | 低能电子衍射 |
| LM | Light Microscopy | 光学显微镜 |
| LOM | Light Optical Microscopy | 光学显微术 |
| LP | Lorentz Polarization | 洛仑兹极化 |
| LSCM | Laser Scanning Confocal Microscope | 激光扫描共聚焦显微镜 |
| OCF | Orientation Correlation Function | 取向相关函数 |
| ODF | Orientation Distribution Function | 取向分布函数 |
| PAGS | Prior Austenite Grain Size | 原奥氏体晶粒尺寸 |
| PFZ | Precipitate Free Zone | 无沉淀区 |
| RA | Relative Accuracy | 相对精度 |
| ROI | Region of Interest | 感兴趣区域 |
| SAD | Selected Area Diffraction | 选区衍射 |
| SAECP | Selected Area Electron Channeling Pattern | 选区电子衍射通道花样 |
| SAED | Selected Area Electron Diffraction | 选区电子衍射 |
| SAM | Scanning Auger Microscopy | 扫描俄歇显微镜 |
| SANS | Small Angle Neutron Scattering | 小角度中子散射 |
| SE | Secondary Electron | 二次电子 |
| SEI | Secondary Electron Image | 二次电子像 |
| SEM | Scanning Electron Microscope | 扫描电子显微镜 |
| SIM | Scanning Ion Microprobe | 扫描离子显微探针 |
| SIMS | Secondary Ion Mass Spectroscopy | 次级离子质谱 |
| SLAM | Scanning Laser Acoustic Microscope | 扫描激光声学显微镜 |
| STEM | Scanning Transmission Electron Microscopy | 扫描透射电子显微镜 |
| STIM | Scanning Transmission Ion Microscopy | 扫描透射离子显微镜 |
| STM | Scanning Tunneling Microscope | 扫描隧道显微镜 |
| TCP | Topologically Close-Packed | 拓扑密排 |
| TEM | Transmission Electron Microscope | 透射电子显微镜 |
| TOFSIMS | Time-of-Flight Secondary Ion Mass Spectrometer | 飞行时间次级离子质谱 |
| TSC | Thermal Sprayed Coating | 热喷涂涂层 |
| UV | Ultraviolet | 紫外线辐射 |
| WD | Working Distance | 工作距离 |
| WDS | Wavelength Dispersive Spectrometry | 波长色散分光仪 |
| XRD | X-ray Diffraction | X射线衍射 |
| XRF | X-ray Fluorescence | X射线荧光 |
| XRM | X-ray Microscopy | X射线显微镜 |
| ZAF | Z-Absorption Fluorescence | ZAF修正（原子序数-吸收-荧光） |
| ZAP | Zone Axis Pattern | 带轴花样 |
| ZOLZ | Zero Order Laue Zone | 零阶劳厄带 |
更多术语将陆续添加。